1. Abnormal Condition Monitoring of Workpieces Based on RFID for Wisdom Manufacturing Workshops
- Author
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Cunji Zhang, Xifan Yao, and Jianming Zhang
- Subjects
radio frequency identification (RFID) ,complex event processing (CEP) ,wisdom manufacturing ,data cleaning ,data mining ,Chemical technology ,TP1-1185 - Abstract
Radio Frequency Identification (RFID) technology has been widely used in many fields. However, previous studies have mainly focused on product life cycle tracking, and there are few studies on real-time status monitoring of workpieces in manufacturing workshops. In this paper, a wisdom manufacturing model is introduced, a sensing-aware environment for a wisdom manufacturing workshop is constructed, and RFID event models are defined. A synthetic data cleaning method is applied to clean the raw RFID data. The Complex Event Processing (CEP) technology is adopted to monitor abnormal conditions of workpieces in real time. The RFID data cleaning method and data mining technology are examined by simulation and physical experiments. The results show that the synthetic data cleaning method preprocesses data well. The CEP based on the Rifidi® Edge Server technology completed abnormal condition monitoring of workpieces in real time. This paper reveals the importance of RFID spatial and temporal data analysis in real-time status monitoring of workpieces in wisdom manufacturing workshops.
- Published
- 2015
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