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Organic light-emitting diodes (OLEDs) have been widely studied because of their various advantages. OLEDs are multi-layered structures consisting of organic and inorganic materials arranged in a heterojunction; the nature of adhesion at their heterogeneous interfaces has a significant effect on their properties. In this study, the origin of macroscopic adhesion was explored in OLEDs using a combination of microscopy techniques applied at different length scales. The different techniques allowed the identification of layers exposed by a peel test, which aided direct characterization of their macroscopic adhesion. Further, the contribution of each exposed layer to macroscopic adhesion could be determined through an analysis of photographic images. Finally, analysis of the local roughness and adhesion confirmed that the interface between an anode and emission layer could play a predominant role in determining the nature of macroscopic adhesion in OLEDs. These results may provide guidelines for exploring the origin of macroscopic adhesion properties through a combination of various microscopy techniques.

Hysteresis loop analysis via piezoresponse force microscopy (PFM) is typically performed to probe the existence of ferroelectricity at the nanoscale. However, such an approach is rather complex in accurately determining the pure contribution of ferroelectricity to the PFM. Here, we suggest a facile method to discriminate the ferroelectric effect from the electromechanical (EM) response through the use of frequency dependent ac amplitude sweep with combination of hysteresis loops in PFM. Our combined study through experimental and theoretical approaches verifies that this method can be used as a new tool to differentiate the ferroelectric effect from the other factors that contribute to the EM response.

Even though nanoscale analysis of magnetic properties is of significant interest, probing methods are relatively less developed compared to the significance of the technique, which has multiple potential applications. Here, we demonstrate an approach for probing various magnetic properties associated with eddy current, coil current and magnetic domains in magnetic inductors using multidimensional magnetic force microscopy (MMFM). The MMFM images provide combined magnetic responses from the three different origins, however, each contribution to the MMFM response can be differentiated through analysis based on the bias dependence of the response. In particular, the bias dependent MMFM images show locally different eddy current behavior with values dependent on the type of materials that comprise the MI. This approach for probing magnetic responses can be further extended to the analysis of local physical features.