1. High Electron Mobility in Epitaxial Graphene on 4H-SiC(0001) via post-growth annealing under hydrogen
- Author
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V. Cavaliere, Emiliano Pallecchi, Abdelkarim Ouerghi, F. Lafont, W. Poirier, Félicien Schopfer, and Dominique Mailly
- Subjects
Electron mobility ,Multidisciplinary ,Materials science ,Condensed Matter - Mesoscale and Nanoscale Physics ,Atmospheric pressure ,Condensed matter physics ,Graphene ,Dangling bond ,FOS: Physical sciences ,Landau quantization ,Quantum Hall effect ,Article ,law.invention ,Electrical resistivity and conductivity ,law ,Mesoscale and Nanoscale Physics (cond-mat.mes-hall) ,Bar (unit) - Abstract
We investigate the magneto-transport properties of epitaxial graphene single-layer on 4H-SiC(0001), grown by atmospheric pressure graphitization in Ar, followed by H2 intercalation. We directly demonstrate the importance of saturating the Si dangling bonds at the graphene/SiC(0001) interface to achieve high carrier mobility. Upon successful Si dangling bonds elimination, carrier mobility increases from 3 000 cm2V−1s−1 to >11 000 cm2V−1s−1 at 0.3 K. Additionally, graphene electron concentration tends to decrease from a few 1012 cm−2 to less than 1012 cm−2. For a typical large (30 × 280 μm2) Hall bar, we report the observation of the integer quantum Hall states at 0.3 K with well developed transversal resistance plateaus at Landau level filling factors of ν = 2, 6, 10, 14… 42 and Shubnikov de Haas oscillation of the longitudinal resistivity observed from about 1 T. In such a device, the Hall state quantization at ν = 2, at 19 T and 0.3 K, can be very robust: the dissipation in electronic transport can stay very low, with the longitudinal resistivity lower than 5 mΩ, for measurement currents as high as 250 μA. This is very promising in the view of an application in metrology.
- Published
- 2014
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