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Functional reliability is one of the important properties of physical systems provided by reliability of system components, in particular, control logical components. The new approach to fully delay testable circuit design oriented to cut overheads and lengths of circuit paths has been developed. Compact representation of all PDF test pairs is reduced to keeping the corresponding generative vector pairs. The number of generative vector pairs does not exceed the doubled number of internal ROBDD nodes originating from the circuit, while the number of the circuit paths can exponentially depend on the number of these internal nodes. The algorithm of involving the PDF test pair from the proper generative vector pair is suggested. This procedure does not require essential calculations. The algorithm of deriving the generative vector pair has a polynomial complexity. [ABSTRACT FROM AUTHOR]

A flow of physical events (photons, electrons, etc.) is studied. One of the mathematical models of such flows is the Markovian arrival process (MAP) of flow of events. The flow functions are considered under conditions of unextendable dead time period. Explicit expressions for the probability density and joint probability density of interarrival interval of the observable flow are presented considering the effect of the unextendable dead time period. The recurrence relations for the observable flow of events are formulated. [ABSTRACT FROM AUTHOR]