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In this work thin films of Ni0.5Zn0.5Fe2O4 were grown on (100) MgO substrates at different deposition temperatures. The films were deposited by the RF sputtering technique at 2.1x10-1 mbar oxygen pressure. The structure of the sintered NiZn ferrite films was evaluated using XRD, showing variations in the intensity of some peaks, probably because the deposition temperature influences the evaporation of Zn. The longitudinal Magneto-Optical Kerr Effect (MOKE) was used to measure magnetization hysteresis loops of the films. An increment was observed in the coercive field and a reduction in the saturation magnetization with the deposition temperature up to a value of 650 ºC. The Jiles-Atherton Model was used to fit the experimental hysteresis loops. The k pinning parameter of the model varies by increasing deposition temperature. [ABSTRACT FROM AUTHOR]