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The existence of crystal glitches in EXAFS data is widely recognized and is usually dealt with during data analysis. However, in many cases, especially as samples become more dilute, the disruption of the data can become irretrievable. The advent of new, high output, double-crystal xray monochromators has made it necessary to investigate the cause of such glitches with a view to reducing them in the original data. The occurrence of multiple reflections within the crystal gives rise to the glitches seen in EXAFS data when the two crystals in a double-crystal monochromator are not accurately aligned. The results of a simple alignment of such a double-crystal monochromator are presented and show a reduction of the glitches in the recorded data. A purpose-built monochromator for further investigation of this problem is described and some results towards the further reduction of glitches are presented. [ABSTRACT FROM AUTHOR]