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Describes the development of electron beam ion sources (EBIS). Construction of the classic EBIS and electron beam ion trap; Use of the ion-by-ion cooling technique to increase ion confinement time; Effect of the electron beam current on the ion yield; Evaluation of an ion source using the multiple reflection of primary electrons.

Measures the current gain of windowless electron multipliers 226EM and EMI 9643/2B for highly charged Ta ions. Calibration of the electron tubes; Application of the electron tubes as detectors of ions emitted from a laser-produced plasma; Factors contributing to the difference between the properties of the electron tubes.

Determines the gain of microchannel plates operated with low bias voltages in the analog mode for Ar[sup q+] ions. Gain emission upon impact of the detected ions; Presentation of measured gain as a function of ion impact velocity; Causes of the increase and decrease in gain.

We present the first photoelectron spectrometry experiment on a singly charged ion beam. Taking advantage of the high photon flux emitted in the undulator SU6 of Super- ACO, we have measured photoelectron spectra produced in the resonant photoionization of Ca[sup +] ions at 33.2-eV photon energy. The success of this experiment depended strongly on the photon flux available. We demonstrate the capability of photoelectron spectrometry to precisely calibrate the photon spectrum emitted in the undulator. [ABSTRACT FROM AUTHOR]

Multiply charged ions of Xe gases were produced through inner-shell photoionization by using synchrotron radiation, and were stored in an rf ion trap. The experimental apparatus for trapping and probing multiply charged ions is described, and results for the measurements on the mass spectra of trapped ions and lifetime of each charge state are presented. [ABSTRACT FROM AUTHOR]

Investigates the characteristics of tantalum ion current from laser-produced plasma. Use of calibrated windowless electron multipliers in obtaining the absolute measurements; Comparison between the ion collector and electrostatic ion energy analyzer signals; Effect of the secondary electron emission on the ion collector signal.

Describes the cryogenic electron beam ion source ion beam transport and identification. Ease in changing the magnet to dial different ion beams; Identification of all charge-states by calibrating the magnet; Importance of the time structure of the ion beams.

Identifies the improvements made on the KSU-CRYEBIS, a cryogenic electron beam ion source. Development of a metering system for instantaneous and time-averaged ion beam currents; Availability of natural Ar, Ne, He, Ch[sub 4] and H[sub 2] to produce ion beams from their major isotope; High-voltage platform and ion beam transport.