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Organic-inorganic perovskite single crystals (SCs) are considered promising semiconductors for high-sensitivity X-ray detectors because of their strong X-ray interaction, low-temperature processability, and excellent properties such as long diffusion length, low defect density, and long carrier lifetime. However, the specific pulse response of MAPbBr 3 SC-based X-ray detectors frequently exhibits a tail and over/undershoots at several conditions, which degrades the X-ray image quality; however, no detailed analysis of these characteristics has been reported thus far. For high-resolution X-ray imaging, it is necessary to obtain an ideal pulse response that is free of tails and over/undershoots. In this study, we investigated the specific X-ray responses of solution-grown MAPbBr 3 SC-based X-ray detectors under various externally applied voltages. Based on the study on charge carrier dynamics, we analyzed the origin of the tail and over/undershoots in X-ray pulse response shapes. We theoretically verified that the unideal pulse response in perovskite SC-based X-ray detectors is attributed to the defect states inherent in perovskite SCs. • X-ray responses of MAPbBr 3 single-crystal detectors with different electrodes are investigated. • The specific pulse responses of the detectors show tail and over/undershoots. • Tail and overshoots can be interpreted as de-trapping and trapping, respectively, on shallow traps. • Undershoot is caused by diffusion currents due to the internal fields and unoccupied vacancies. [ABSTRACT FROM AUTHOR]