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Abstract: A new method, based on Digital Holographic Microscopy (DHM), to visualize and to analyze etched tracks in SSNTD has been developed. The proposed method is based on the possibility of the digital holography to perform whole reconstruction of the recorded wave front, so that phase and intensity distribution at a plane located between the object and recording plane and along the reconstructed image of the object can be determined. In a DHM system, the back focal plane of the lens can be reconstructed so that complex amplitudes of the Fraunhofer diffraction of light distribution across the object can be known. With the knowledge and manipulation of the components of this plane is possible to design different methods of image analysis. In this paper, the DHM method was applied to determine the track parameters in CR-39 detectors, showing that most of studies carried out with Confocal Microscopy and Atomic Force Microscopy could be also done, with the sufficient exactitude and precision, but in a simpler and more economic way. The developed microholographic method provides a new alternative procedure that overcomes the current techniques at least in technological simplicity. [ABSTRACT FROM AUTHOR]

Computer programs have been developed to calculate track parameters and to plot track openings and wall profiles. The programs are based on equations derived for three-dimensional consideration of track development. All possible cases of track openings and wall profiles are obtainable from these equations. Results are given for lengths of major and minor axes, track depths and surface areas of track openings. Some examples of track openings and wall profiles are also presented. [Copyright &y& Elsevier]

Three-dimensional analytical determinations of track parameters are extended to cases where the tracks are in the rounded and spherical phases of development. The equation for the track wall in three dimensions and the equation of contour line of the opening were derived for all types of tracks. The expression for the surface area of the track opening has also been found. The equations come up to the well-known expressions for minor and major axes for the special case of constant track etch rate. [Copyright &y& Elsevier]