7 results on '"Pokorny, Petr"'
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2. Analysis of Seidel aberration coefficients of thick lens with arbitrary focal length.
3. The science case for a far-infrared interferometer in the era of JWST and ALMA.
4. Analysis of method of determination of refractive index and Abbe number of lens
5. The science case for a far-infrared interferometer in the era of JWST and ALMA
6. Temperature-dependent spectral ellipsometry: a powerful technique for thin film investigations.
7. Method for interferometric testing of optical surfaces based on evaluation of similarity of nominal and measured interferograms
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