127 results on '"Dale, E"'
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2. Electron-excited energy dispersive x-ray spectrometry in the variable pressure scanning electron microscope (EDS/VPSEM): it's not microanalysis anymore!
3. Rigorous quantitative elemental microanalysis by scanning electron microscopy/energy dispersive x-ray spectrometry (SEM/EDS) with spectrum processing by NIST DTSA-II
4. Compact tunable kHz-linewidth semiconductor laser stabilized with a whispering-gallery mode microresonator.
5. Solving the micro-to-macro spatial scale problem with milliprobe x-ray fluorescence/x-ray spectrum imaging.
6. A multi-wavelength hybrid waveguide-fiber cavity 2.1 μm laser
7. High-operability VLWIR array via interdigitated pixel utilization.
8. Investigating properties of surfaces and thin films using microsphere whispering-gallery modes.
9. Terahertz interferometric imaging of RDX.
10. Terahertz interferometric and synthetic aperture imaging.
11. The Chandra X-ray Observatory calibration database (CalDB): building, planning, and improving.
12. Terahertz interferometric imaging of a concealed object.
13. THz reflection spectroscopy of C-4 explosive and its detection through interferometric imaging.
14. Grain size dependent scattering studies of common materials using THz time domain techniques.
15. Biological material imaging using THz-echo analysis method.
16. Physical imaging of void using ultrafast light in optical precision.
17. Iridium optical constants for the Chandra X-ray Observatory from reflectance measurements of 0.05-12 keV.
18. Design and development of optical coatings on laser bar facets.
19. Design and demonstration of a data integrated video sensor.
20. Iridium optical constants from synchrotron reflectance measurements over 0.05- to 12-keV x-ray energies.
21. Site testing issues for the frequency agile solar radiotelescope (FASR).
22. Initial capability of new photomask-blank deposition tool.
23. OPC and image optimization using localized frequency analysis.
24. LWIR, photovoltaic, Hg1-xCdxTe, and FPA performance for remote sensing applications.
25. Absolute effective area of the Chandra high-resolution mirror assembly (HRMA).
26. SPM metrological assurance using a heterodyne interferometer
27. Photomask linewidth comparison by PTB and NIST
28. Lateral tip control effects in CD-AFM metrology: the large tip limit
29. How a lesson on microscopes supports learning about light in elementary schools
30. Continuous monitoring of tip radius during atomic force microscopy imaging
31. Hitachi TM3030 engages at the nexus of cross-curriculum teaching and vertical articulation
32. Using a university characterization facility to educate the public about microscopes: light microscopes to SEM
33. SEM/EDS analysis for problem solving in the food industry
34. Exploration of mXRF analysis of gunshot residue from cartridge cases
35. A compilation of cold cases using scanning electron microscopy at the University of Rhode Island
36. Investigation of electron beam irradiation effect on pore formation
37. Sub-diffraction-limit imaging using mode multiplexing
38. Distributed web-based simulation for protecting intellectual property.
39. Broadband microwave imaging spectroscopy with a solar-dedicated array.
40. Functional and real-time requirements of a multisensor data fusion (MSDF) situation and threat assessment (STA) resource management (RM) system.
41. AXAF-mirror effective area calibration using the C-continuum source and solid state detectors.
42. Development of beamline U3A for AXAF synchrotron reflectivity calibrations.
43. Feasibility study of ALS beamline 6.3.2 in the calibration of AXAF: initial reflectivity results.
44. Modeling of synchrotron reflectance calibrations of AXAF iridium-coated witness mirrors over 2 to 12 keV.
45. Use of Na- alumina crystals in a soft x-ray synchrotron beamline.
46. Weapon engagement management for ship defense.
47. AXAF synchrotron witness mirror calibrations 2 to 12 keV.
48. Determination of optical constants for AXAF mirrors from 0.05 to 1.0 keV through reflectance measurements.
49. Optical constants from synchrotron reflectance measurements of AXAF witness mirrors 2 to 12 keV.
50. Reflectance calibrations of AXAF witness mirrors using synchrotron radiation: 2 to 12 keV.
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