1. Phase artefact reduction in magnetic resonance electrical impedance tomography (MREIT)
- Author
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Ohin Kwon, Byung Il Lee, Chunjae Park, Eung Je Woo, and Hyun Chan Pyo
- Subjects
Scanner ,Materials science ,Phase (waves) ,Conductivity ,Sensitivity and Specificity ,Noise (electronics) ,Imaging phantom ,Pattern Recognition, Automated ,Optics ,Nuclear magnetic resonance ,Data acquisition ,Quality (physics) ,Image Interpretation, Computer-Assisted ,Electric Impedance ,Radiology, Nuclear Medicine and imaging ,Plethysmography, Impedance ,Tomography ,Radiological and Ultrasound Technology ,Phantoms, Imaging ,business.industry ,Reproducibility of Results ,Image Enhancement ,Magnetic Resonance Imaging ,Magnetic field ,Artifacts ,business ,Algorithms - Abstract
Cross-sectional conductivity imaging in magnetic resonance electrical impedance tomography (MREIT) requires the measurement of internal magnetic flux density using an MRI scanner. Current injection MRI techniques have been used to induce magnetic flux density distributions that appear in phase parts of the obtained MR signals. Since any phase error, as well as noise, deteriorates the quality of reconstructed conductivity images, we must minimize them during the data acquisition process. In this paper, we describe a new method to correct unavoidable phase errors to reduce artefacts in reconstructed conductivity images. From numerical simulations and phantom experiments, we found that the zeroth- and first-order phase errors can be effectively minimized to produce better conductivity images. The promising results suggest that this technique should be employed together with improved MREIT pulse sequences in future studies of high-resolution conductivity imaging.
- Published
- 2006