Descriptor: "SCANNING electron microscopes" / Journal: physics, chemistry & applications of nanostructures: reviews & short notes - proceedings of international conference nanomeeting - 2011 / Publication Type: Conference Materials and Reports - Searchworks@Jio Institute Digital Library Search Results

Your search keyword '"SCANNING electron microscopes"' showing total 3 results

Start Over Descriptor "SCANNING electron microscopes" Publication Type Conference Materials Publication Type Reports Journal physics, chemistry & applications of nanostructures: reviews & short notes - proceedings of international conference nanomeeting - 2011

3 results on '"SCANNING electron microscopes"'

1. PREPARATION OF FINE-GRAINED CERAMICS FOR VARISTOR APPLICATION.

Author: VOKHMINTCEV, K. V., TRUSOVA, E. A., SHELEKHOV, E. V., CHALYKH, A. E., and PISAREV, S. A.
Subjects: *GRAIN size, *CERAMIC materials, *VARISTORS, *CHEMICAL sample preparation, *SCANNING electron microscopes
Published: 2011

2. INFLUENCE OF THE SUBMICRON LAYER OF THE IRRADIATION-INDUCED DEFECTS ON THE CAPACITANCE OF SILICON pn-DIODES.

Author: POKLONSKI, N. A., GORBACHUK, N. I., ERMAKOVA, A. V., SHPAKOVSKI, S. V., FILIPENIA, V. A., SKURATOV, V. A., and WIECK, A.
Subjects: *CAPACITANCE meters, *SILICON diodes, *PIN diodes, *KRYPTON, *SCANNING electron microscopes
Published: 2011

3. SPIN VALVES WITH THE TRANSPORT LAYER OF A NON-CONJUGATED POLYMER.

Author: VOROB'EVA, N. V., LACHINOV, A. N., and LACHINOV, A. A.
Subjects: *SPIN valves, *CONJUGATED polymers, *FERROMAGNETISM, *NANOSTRUCTURED materials, *SCANNING electron microscopes
Published: 2011

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3 results on '"SCANNING electron microscopes"'

1. PREPARATION OF FINE-GRAINED CERAMICS FOR VARISTOR APPLICATION.

2. INFLUENCE OF THE SUBMICRON LAYER OF THE IRRADIATION-INDUCED DEFECTS ON THE CAPACITANCE OF SILICON pn-DIODES.

3. SPIN VALVES WITH THE TRANSPORT LAYER OF A NON-CONJUGATED POLYMER.

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3 results on '"SCANNING electron microscopes"'

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