1. Nanoscale electrical properties of cluster-assembled palladium oxide thin films
- Author
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L. Gerosa, Cristina Lenardi, Francesca Fiorentini, Tommaso Mazza, Marco Sampietro, Giorgio Ferrari, Valeria Cassina, Alessandro Podestà, Paolo Milani, Cassina, V, Gerosa, L, Podestà, A, Ferrari, G, Sampietro, M, Fiorentini, F, Mazza, T, Lenardi, C, and Milani, P
- Subjects
Materials science ,sezele ,Condensed matter physics ,Photoemission spectroscopy ,chemistry.chemical_element ,palladium, nanoscale electrical ,Dielectric ,Condensed Matter Physics ,Electronic, Optical and Magnetic Materials ,chemistry ,Microscopy ,Cluster (physics) ,Thin film ,Electrical conductor ,Nanoscopic scale ,Palladium - Abstract
The electrical properties of cluster-assembled nanostructured palladium oxide $({\text{ns-PdO}}_{x})$ thin films grown by supersonic cluster beam deposition have been characterized by means of a customized ac current-sensing atomic force microscope. Scanning impedance microscopy is shown to provide a deep picture of the electrical properties of thin nanostructured interfaces even in the case of very soft and poorly adherent films. In particular, the dielectric constant of ${\text{ns-PdO}}_{x}$ can be quantitatively determined as well as its $I\text{\ensuremath{-}}V$ characteristics. Moreover, the measurement of the tip-sample parasitic capacitance can be exploited to probe the overall mesoscale conductive character of thin films and to give a complementary and more precise view of the oxidation of ${\text{ns-PdO}}_{x}$ obtained by x-ray photoemission spectroscopy.
- Published
- 2009