1. Charge compensating defects study of YbF-doped BaF crystals using dielectric loss.
- Author
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Nicoara, Irina and Stef, Marius
- Subjects
BARIUM fluoride ,TOPOLOGICAL defects (Physics) ,DIELECTRIC relaxation ,OPTICAL spectroscopy ,YTTERBIUM compounds - Abstract
YbF-doped BaF crystals with various concentrations of YbF (0.05, 0.1, 0.17, 0.2 mol) have been grown using the conventional Bridgman method. Dielectric relaxation is used to study the charge compensating defects in BaF crystals with low YbF concentration. The optical absorption spectra reveal the existence of both Yb (in UV domain) and Yb (in IR domain) ions. In the investigated temperature range (150-320 K) we have observed only one type of dielectric relaxation. This relaxation with activation energy eV is associated with trigonal-type () centers. The charge compensating defects are discussed while taking also into account the optical absorption spectra and the calculated number of NNN dipoles whose relaxation is observed. [ABSTRACT FROM AUTHOR]
- Published
- 2016
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