1. Effects of MgO impurities and micro-cracks on the critical current density of Ti-sheathed MgB2 wires
- Author
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Kamel Salama, M. Hanna, C. Hoyt, Bing Lv, Fei Yen, Hui Fang, Gan Liang, M. Alessandrini, and Jianming Zeng
- Subjects
Diffraction ,Materials science ,Condensed matter physics ,Scanning electron microscope ,Energy Engineering and Power Technology ,Condensed Matter Physics ,Magnetic hysteresis ,Electronic, Optical and Magnetic Materials ,Magnetization ,Impurity ,Electrical resistivity and conductivity ,X-ray crystallography ,Critical current ,Electrical and Electronic Engineering - Abstract
Ti-sheathed monocore MgB 2 wires with improved magnetic critical current density ( J c ) have been fabricated by in situ powder-in-tube (PIT) method and characterized by magnetization, X-ray diffraction, scanning electron microscopy and electrical resistivity measurements. For the best wire, the magnetic J c values at 5 K and fields of 2 T, 5 T, and 8 T are 4.1 × 10 5 A/cm 2 , 7.8 × 10 4 A/cm 2 , and 1.4 × 10 4 A/cm 2 , respectively. At 20 K and fields of 0.5 T and 3 T, the J c values are about 3.6 × 10 5 A/cm 2 and 3.1 × 10 4 A/cm 2 , respectively, which are much higher than those of the Fe-sheathed mono-core MgB 2 wires fabricated with the same in situ PIT process and under the same fabricating conditions. It appears that the overall J c for the average Ti-sheathed wires is comparable to that of the Fe-sheathed wires. Our X-ray diffraction and scanning electron microscopy analysis indicates that J c in the Ti-sheathed MgB 2 wires can be strongly suppressed by MgO impurities and micro-cracks.
- Published
- 2007
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