1. Fabrication Tolerances' Impact on an ODAC-Based PAM-4 Transmitter.
- Author
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Abejide, Adebayo E., Santos, João, Chattopadhyay, Tanay, Rodrigues, Francisco, Lima, Mario, and Teixeira, António
- Subjects
ANALOG-to-digital converters ,DIGITAL-to-analog converters ,SYMBOL error rate ,PULSE amplitude modulation ,PULSE circuits - Abstract
Photonic integrated circuits (PIC) devices are impacted by fabrication tolerances and therefore, prior knowledge of such variations could improve the PIC fabrication process and overall yield. This paper presents a method for predicting the fabrication impacts on a telecommunication optical digital to analog converter (oDAC)-based pulse amplitude modulator level four (PAM-4) transmitter as a case study where the certainty of this passive device is subjected to random variation. Our findings allow us to estimate the production yield in a fabrication scenario using the symbol error rate (SER) benchmark and this contributes to the study of the viability of oDAC PAM-4 transmitters to replace conventional electrical digital to analog converter (eDAC) PAM-4 transmitters. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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