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We present the first experimental demonstration of a new fiber-chip grating coupler concept that exploits the blazing effect by interleaving the standard full (220 nm) and shallow etch (70 nm) trenches in a 220 nm thick silicon layer. The high directionality is obtained by controlling the separation between the deep and shallow trenches to achieve constructive interference in the upward direction and destructive interference toward the silicon substrate. Utilizing this concept, the grating directionality can be maximized independent of the bottom oxide thickness. The coupler also includes a subwavelength-engineered index-matching region, designed to reduce the reflectivity at the interface between the injection waveguide and the grating. We report a measured fiber-chip coupling efficiency of −1.3 dB , the highest coupling efficiency achieved to date for a surface grating coupler in a 220 nm silicon-on-insulator platform fabricated in a conventional dual-etch process without high-index overlays or bottom mirrors.

We report a spatial heterodyne Fourier-transform spectrometer implemented with an array of optical fiber interferometers. This configuration generates a wavelength-dependent stationary interferogram from which the input spectrum is retrieved in a single shot without scanning elements. Furthermore, fabrication and experimental deviations from the ideal behavior of the device are corrected by spectral inversion algorithms. The spectral resolution of our system can be readily scaled up by incorporating longer optical fiber delays, providing a pathway toward surpassing current spectroscopy resolution limits. © 2013 Optical Society of America.

This Letter introduces an enhanced cavity-waveguide coupling architecture based upon slow-light engineering in a two-port photonic crystal system. After analyzing the system transmittance using coupled-mode theory, the system is probed experimentally and shown to have increased transmittance due to the enhanced cavity-waveguide coupling. Such a coupling architecture may facilitate next-generation planar lightwave circuitry such as onchip quantum information processing or high precision light-matter sensing applications.

We report a compact high-resolution arrayed waveguide grating (AWG) interrogator system designed to measure the relative wavelength spacing between two individual resonances of a tilted fiber Bragg grating (TFBG) refractometer. The TFBG refractometer benefits from an internal wavelength and power reference provided by the core mode reflection resonance that can be used to determine cladding mode perturbations with high accuracy. The AWG interrogator is a planar waveguide device fabricated on a silicon-on-insulator platform, having 50 channels with a 0.18 nm wavelength separation and a footprint of 8 mm×8 mm. By overlaying two adjacent interference orders of the AWG we demonstrate simultaneous monitoring of two widely separated resonances in real time with high wavelength resolution. The standard deviation of the measured wavelength shifts is 1.2 pm, and it is limited by the resolution of the optical spectrum analyzer used for the interrogator calibration measurements.

We reporta stationary Fourier-transform spectrometer chip implemented in silicon microphotonic waveguides. The device comprises an array of 32 Mach-Zehnder interferometers (MZIs) with linearly increasing optical path delays between the MZI arms across the array. The optical delays are achieved by using Si-wire waveguides arranged in tightly coiled spirals with a compact device footprint of 12 mm2. Spectral retrieval is demonstrated in a single measurement of the stationary spatial interferogram formed at the output waveguides of the array, with a wavelength resolution of 40 pm within a free spectral range of 0.75 nm. The phase and amplitude errors arising from fabrication imperfections are compensated using a transformation matrix spectral retrieval algorithm. © 2013 Optical Society of America.