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Start Over Author "Hermelink, Antje" Journal optics express
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1. Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy

Author

Hermann, Peter, primary, Hoehl, Arne, additional, Ulrich, Georg, additional, Fleischmann, Claudia, additional, Hermelink, Antje, additional, Kästner, Bernd, additional, Patoka, Piotr, additional, Hornemann, Andrea, additional, Beckhoff, Burkhard, additional, Rühl, Eckart, additional, and Ulm, Gerhard, additional

Published
2014
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