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Abstract: In experiments, we have found an abnormal relationship between probability of laser induced damage and number density of surface inclusion. From results of X-ray diffraction (XRD) and laser induced damage, we have drawn a conclusion that bulk inclusion plays a key role in damage process. Combining thermo-mechanical damage process and statistics of inclusion density distribution, we have deduced an equation which reflects the relationship between probability of laser induced damage, number density of inclusion, power density of laser pulse, and thickness of films. This model reveals that relationship between critical sizes of the dangerous inclusions (dangerous inclusions refer to the inclusions which can initialize film damage), embedded depth of inclusions, thermal diffusion length and tensile strength of films. This model develops the former work which is the statistics about surface inclusion. [Copyright &y& Elsevier]

Abstract: Y2O3/SiO2 coatings were deposited on fused silica by electron beam evaporation. A continuous wave CO2 laser was used to condition parts of the prepared samples at different scanning speeds in the air. LAMBDA 900 spectrometer was used to investigate the changes of the transmittance and residual reflection spectrum. A Nomarski microscope under dark field was used to examine the changes of the micro defect density. The changes of the surface roughness and the microstructure of the film before and after conditioning were investigated by AFM and X-ray diffraction, respectively. We found that laser-induced damage threshold (LIDT) of the films conditioning at 30mm/s scanning speed was increased by more than a factor of 3 over the thresholds of the as-deposited films. The conditioning effect was correlated with an irradiation-induced decrease of the defect density and absorption of the films. [Copyright &y& Elsevier]

Abstract: Four mirror coatings were designed for transporting 1064nm light, and prepared under the same process parameters. The laser induced damage threshold (LIDT), electric field distribution, as well as the damage morphology of the prepared transport mirror coating was investigated. The results indicate that the SiO2 overcoat layer and electric field distribution have a great impact on the LIDT and damage morphology of the transport mirror coating. A thicker SiO2 overcoat layer can suppress the delamination damage morphology, and significantly increase the LIDT. For the designs with similar SiO2 overcoat layer thickness, the nano-absorbing defects can survive at higher laser fluence in the design with lower electric field intensity. In addition, the HfO2 over SiO2 interface has a better interfacial strength and less “invisible” nano-absorbing defects than the SiO2 over HfO2 interface, suggesting that improving the SiO2 over HfO2 interfacial quality will be an effective way to enhance the laser damage performance of the transport mirror coating. [Copyright &y& Elsevier]

Abstract: Multiple laser irradiations induce a critical issue as regards the lifetime of optical components. HfO2/SiO2 AR coatings for 1064nm were prepared by conventional electron beam deposition. The evolution of laser-induced damage threshold (LIDT) and 100% damage probability threshold with shot numbers were investigated to illustrate the incubation mechanism of defect-induced damages and the intrinsic material modifications of coatings. It was found that the multi-shot LIDTs were lower than that of single-shot because of “fatigue effect”. The 100% damage probability threshold also decreased with increasing shot numbers. This incubation phenomenon implied laser-induced modifications to the coating material that weaken it to subsequent pulse exposures. LID probability curves simulated with a statistical model assuming Gaussian distribution of defect threshold were used to highlight information on defects. Simulation results showed that the thresholds of different kinds of defects decreased with the increase of shot numbers. Optical microscopy, scanning electron microscopy (SEM), atomic force microscopy (AFM) and step profiler were employed in mapping damage morphology features and damage depth to discuss the initiators and mechanism of damage initiation. Additionally, damage regions were accessed by X-ray photoelectron spectroscopy (XPS) to indicate the changes in elemental content and valence of the materials with increasing pulse numbers. [Copyright &y& Elsevier]