1. Applications of heavy ion microprobe for single event effects analysis
- Author
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Reed, Robert A., Vizkelethy, Gyorgy, Pellish, Jonathan A., Sierawski, Brian, Warren, Kevin M., Porter, Mark, Wilkinson, Jeff, Marshall, Paul W., Niu, Guofu, Cressler, John D., Schrimpf, Ronald D., Tipton, Alan, and Weller, Robert A.
- Subjects
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ION bombardment , *COLLISIONS (Nuclear physics) , *QUANTUM theory , *NUCLEAR physics - Abstract
Abstract: The motion of ionizing-radiation-induced rogue charge carriers in a semiconductor can create unwanted voltage and current conditions within a microelectronic circuit. If sufficient unwanted charge or current occurs on a sensitive node, a variety of single event effects (SEEs) can occur with consequences ranging from trivial to catastrophic. This paper describes the application of heavy ion microprobes to assist with calibration and validation of SEE modeling approaches. [Copyright &y& Elsevier]
- Published
- 2007
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