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In this work the Bridgman crystal growth and scintillation properties of both undoped and Tl-doped Cs 3 Cu 2 I 5 are presented. This material is very attractive for gamma and X-ray detection applications, with a density of 4.53 g/cm3 and effective atomic number of 51.9. Undoped Cs 3 Cu 2 I 5 had a light yield of 41,500 photons/MeV, with an energy resolution of 4.4% at 662 keV. Thallium doping at 0.5 mol % resulted in a much-improved scintillation response, in which light yield increased to 98,200 photons/MeV and energy resolution reduced to 3.3% at 662 keV. The X-ray excited emission is centered at 442 nm for the undoped and 500 nm for the Tl-doped crystals. The undoped emission is broad, typical of excitonic emission, while thallium doping results in an even broader band with features of both the undoped and thallium defect-mediated emissions. • Transparent single crystals of undoped Cs 3 Cu 2 I 5 and Cs 3 Cu 2 I 5 (Tl) were grown via the Bridgman technique. • Phase purity was established via powder XRD analysis. • Undoped Cs 3 Cu 2 I 5 has 41,500 photons/MeV and 4.4% energy resolution at 662 keV. • Tl doping at 0.5 mol% improves light yield to 98,200 photons/MeV and energy resolution to 3.3%. [ABSTRACT FROM AUTHOR]