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We investigate electronic and optoelectronic properties of few-layer palladium diselenide (PdSe2) phototransistors through spatially-resolved photocurrent measurements. A strong photocurrent resonance peak is observed at 1060 nm (1.17 eV), likely attributed to indirect optical transitions in few-layer PdSe2. More interestingly, when the thickness of PdSe2 flakes increases, more and more photocurrent resonance peaks appear in the near-infrared region, suggesting strong interlayer interactions in few-layer PdSe2 help open up more optical transitions between the conduction and valence bands of PdSe2. Moreover, gate-dependent measurements indicate that remarkable photocurrent responses at the junctions between PdSe2 and metal electrodes primarily result from the photovoltaic effect when a PdSe2 phototransistor is in the off-state and are partially attributed to the photothermoelectric effect when the device turns on. We also demonstrate PdSe2 devices with a Seebeck coefficient as high as 74 μV K-1 at room temperature, which is comparable with recent theoretical predications. Additionally, we find that the rise and decay time constants of PdSe2 phototransistors are ∼156 μs and ∼163 μs, respectively, which are more than three orders of magnitude faster than previous PdSe2 work and two orders of magnitude over other noble metal dichalcogenide phototransistors, offering new avenues for engineering future optoelectronics.

We report a reversible photo-induced doping effect in two-dimensional (2D) tungsten diselenide (WSe2) field effect transistors on hexagonal boron nitride (h-BN) substrates under low-intensity visible light illumination (∼10 nW μm-2). Our experimental results have shown that this reversible doping process is mainly attributed to two types of defects in h-BN substrates. Moreover, the photo-doped WSe2 transistors can be stable for more than one week in a dark environment and maintain the high on/off ratio (108) and carrier mobility, since there are no additional impurities involved during the photo-induced doping process to increase the columbic scattering in the conducting channel. These fundamental studies not only provide an accessible strategy to control the charge doping level and then to achieve a writing/erasing process in 2D transistors, but also shed light on the defect states and interfaces in 2D materials.

We investigate the photocurrent generation mechanisms at a vertical p-n heterojunction between black phosphorus (BP) and molybdenum disulfide (MoS2) flakes through polarization-, wavelength-, and gate-dependent scanning photocurrent measurements. When incident photon energy is above the direct band gap of MoS2, the photocurrent response demonstrates a competitive effect between MoS2 and BP in the junction region. In contrast, if the incident photon energy is below the band gap of MoS2 but above the band gap of BP, the photocurrent response at the p-n junction exhibits the same polarization dependence as that at the BP-metal junction, which is nearly parallel to the MoS2 channel. This result indicates that the photocurrent signals at the MoS2-BP junction primarily result from the direct band gap transition in BP. These fundamental studies shed light on the knowledge of photocurrent generation mechanisms in vertical 2D semiconductor heterojunctions, offering a new way of engineering future two-dimensional materials based optoelectronic devices.