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Your search keyword '"D.W. Heikkinen"' showing total 2 results
Start Over Author "D.W. Heikkinen" Journal mrs proceedings
2 results on '"D.W. Heikkinen"'

1. Investigation of Lead Iodide Crystals for Use as High Energy Solid State Radiation Detectors

Author

A.E. Pontau, H. N. Jayatirtha, Arlyn J. Antolak, Arnold Burger, X. J. Bao, H. Feemster, D.W. Heikkinen, Tuviah E. Schlesinger, Dominique C. David, Graham Bench, Robert A. Anderson, Ralph B. James, and D.H. Morse

Subjects
chemistry.chemical_classification, High energy, Materials science, business.industry, Radiochemistry, Detector, Iodide, Solid-state, Crystal growth, Particle detector, Lead (geology), chemistry, Optoelectronics, business
Abstract

Significant developments have occurred in the technology of room-temperature PbI2 nuclear sensors which lead to some improvements in the detection of high energy gamma-rays. Discussion of crystal growth, purification, monitoring purification, and detector processing are reviewed as they relate to device performance.

Published
1993

2. Analysis of HgI2 And PbI2 Crystals and Detectors by Particle-Induced X-Ray Emission (PIXE) and Ion Backscattering Spectroscopy (IBS)

Author

Graham Bench, L. van den Berg, Dominique C. David, Arlyn J. Antolak, Ralph B. James, D.W. Heikkinen, Arnold Burger, D.H. Morse, and A.E. Pontau

Subjects
Materials science, Solid-state physics, Elemental analysis, Detector, Analytical chemistry, Trace element, Particle-induced X-ray emission, Spectroscopy, Microanalysis, Ion
Abstract

The Ion Micro-Analysis Group (IMAG) in Livermore conducts quantitative trace elemental analysis with PIXE and depth profiling with IBS using an MeV ion microbeam. The system has the capability to produce two-dimensional trace element and IBS images. PIXE analyses have been conducted on HgI2 and PbI2 crystals and detector materials in order to identify and quantify near surface trace contaminants. IBS measurements have been conducted to investigate elemental depth distributions in various materials. The results of measurements on several different samples are reported and a discussion of factors affecting quantitative in vacuo microanalysis of these materials is presented.

Published
1993

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