Descriptor: "TEST systems" / Journal: microwaves & rf / Language: english / Publication Year Range: Last 10 years - Searchworks@Jio Institute Digital Library Search Results

Your search keyword '"TEST systems"' showing total 7 results

Start Over Descriptor "TEST systems" Publication Year Range Last 10 years Language english Journal microwaves & rf

Subjects: *5G networks, *ANTENNA arrays, *MODULAR coordination (Architecture), *TEST systems
Abstract: The test system enables small-cellwaveform generation and analysis for 5Gradio technologies and allows for real-time RFparametric analysis for small-cell products. All signalgeneration, analysis, processing, and RFfront-end switching are self-contained inside asingle chassis. This AiP module is designed toenable A/2 wavelength antenna lattice spacingwhen tiled together to support higher-powerapplications. [Extracted from the article]
Published: 2022

Author: BLANCHARD, SCOTT
Subjects: *TEST systems, *TESTING, *PHASE shifters, *AUTOMATIC identification, *AGILE software development
Abstract: With a few of these devices, alaptop, a simple GUI, and a USB cord, designers are quicklyconfirming or denying various networking and signal managementtechniques and identifying the best components fortheir unique signal chains. GLO:5z3/01feb20:37n1.jpg PHOTO (COLOR): Lab Bricks developed by Vaunix represent a suite of solid-stateprogrammable RF test devices that include attenuators, signalgenerators, phase shifters, and switches in various RF/microwave bands. gl. [Extracted from the article]
Published: 2020

Author: DeMARTINO, CHRIS
Subjects: *TESTING, *TEST systems
Abstract: Rohde & Schwarz offers four versions Rohde & Schwarz offers an option to GLO:5z3/01aug19:46n1.jpg PHOTO (COLOR): At IMS 2019, Rohde & Schwarz displayed this ZNBT40. [Extracted from the article]
Published: 2019

Subjects: *PHASED array antennas, *SIGNAL generators, *TESTING, *TEST systems
Abstract: MmWave 5G packaged-part test solution, Nl, Tessolve, and Johnstech collaborated. [Extracted from the article]
Published: 2019

Subjects: *TEST systems
Abstract: The article evaluates the PXI test system from Keysight Technologies.
Published: 2017

Subjects: *MILITARY weapons, *TEST systems, *AIRPLANES, *MILITARY supplies
Abstract: The article offers information on the MTS-209 Common Armament and MTS-3060 SmartCan Universal O-Level Armament Test Sets for airplane weapons from Marvin Test Solutions Inc.
Published: 2017

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