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This paper proposes a method to obtain the isothermal static DC curves of microwave FET power amplifiers, avoiding the use of pulsed measurements and accounting for the self-heating problem in this type of device. The method requires the determination of the thermal resistance of the device under test and the measurement of its static DC curves under different ambient temperatures. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 43: 378–380, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20475 [ABSTRACT FROM AUTHOR]