Search

Your search keyword '"Peter Y. Eastman"' showing total 3 results
Start Over Author "Peter Y. Eastman" Journal microscopy and microanalysis
3 results on '"Peter Y. Eastman"'

1. Correlating Surface Roughness and Binder Erosion to Tint Retention of Coatings

Author

Cory Valente, Michael B. Clark, Junsi Gu, Meghan Koback, John A. Reffner, Johnpeter Ngunjiri, and Peter Y. Eastman

Subjects
Materials science, Erosion, Surface roughness, 02 engineering and technology, Composite material, 010402 general chemistry, 021001 nanoscience & nanotechnology, 0210 nano-technology, 01 natural sciences, Instrumentation, 0104 chemical sciences
Published
2017
Full Text
View/download PDF

2. Silver Nanowire Diameter and Yield Characterization by High-Throughput SEM and Image Analysis

Author

Ellen Keene, William A. Heeschen, Peter Y. Eastman, and Clifford S. Todd

Subjects
Yield (engineering), Materials science, Nanotechnology, 02 engineering and technology, Silver nanowires, 010402 general chemistry, 021001 nanoscience & nanotechnology, 0210 nano-technology, 01 natural sciences, Instrumentation, Throughput (business), 0104 chemical sciences, Characterization (materials science)
Published
2016
Full Text
View/download PDF

3. Characterization of Silver Nanowires by Scanning Electron Microscopy and Image Analysis

Author

X.-Q. Liu, G. Athens, A. Malek, D. Werner, Peter Y. Eastman, and Garo Khanarian

Subjects
Materials science, business.industry, Scanning electron microscope, Scanning ion-conductance microscopy, Scanning confocal electron microscopy, Optoelectronics, Energy filtered transmission electron microscopy, Silver nanowires, business, Instrumentation, Characterization (materials science)
Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Published
2012
Full Text
View/download PDF

Catalog

Books, media, physical & digital resources
See catalog results