Author: "Sun, Xiaochen" / Journal: microelectronics reliability - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Sun, Xiaochen"' showing total 3 results

Start Over Author "Sun, Xiaochen" Journal microelectronics reliability

3 results on '"Sun, Xiaochen"'

1. Utilizing CNN to predict homogeneous thermo-mechanical properties of conductive layers for reliability numerical analysis in electronics

Author: Wan, Guoshun, Dong, Qi, Sun, Xiaochen, Zheng, Hao, Cheng, Mengxuan, Qiao, Wen, and Jia, Yuxi
Published: 2024
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2. Cross-scale numerical analysis of PCB lamination process by an innovative partitioned homogenization method for the non-uniform curing shrinkage effect

Author: Wan, Guoshun, Dong, Qi, Sun, Xiaochen, Zheng, Hao, Cheng, Mengxuan, Zhao, Zhiyan, and Jia, Yuxi
Published: 2024
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3. Highly efficient and accurate algorithm for multiscale equivalent modeling and mechanical performance simulation of printed circuit boards

Author: Wan, Guoshun, Dong, Qi, Sun, Xiaochen, Cheng, Mengxuan, Zheng, Hao, Zhao, Zhiyan, and Jia, Yuxi
Published: 2023
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