Author: "Piva, F" / Journal: microelectronics reliability - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Piva, F"' showing total 3 results

Start Over Author "Piva, F" Journal microelectronics reliability

3 results on '"Piva, F"'

1. Bias-dependent degradation of single quantum well on InGaN-based light emitting diode

Author: Casu, C., Buffolo, M., Caria, A., Piva, F., De Santi, C., Meneghesso, G., Zanoni, E., and Meneghini, M.
Published: 2023
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2. Degradation mechanisms in high power InGaN semiconductor lasers investigated by electrical, optical, spectral and C-DLTS measurements

Author: Piva, F., De Santi, C., Buffolo, M., Taffarel, M., Meneghesso, G., Zanoni, E., and Meneghini, M.
Published: 2020
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3. Stability and degradation of AlGaN-based UV-B LEDs: Role of doping and semiconductor defects

Author: Piva, F., De Santi, C., Deki, M., Kushimoto, M., Amano, H., Tomozawa, H., Shibata, N., Meneghesso, G., Zanoni, E., and Meneghini, M.
Published: 2019
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