Author: "Miura D" / Journal: microelectronics reliability - Searchworks@Jio Institute Digital Library Search Results

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Start Over Author "Miura D" Journal microelectronics reliability

3 results on '"Miura D"'

1. Young's modulus of a sintered Cu joint and its influence on thermal stress

Author: Ishizaki, T., Miura, D., Kuno, A., Hasegawa, K., Usui, M., and Yamada, Y.
Published: 2017
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2. Power cycle reliability of Cu nanoparticle joints with mismatched coefficients of thermal expansion

Author: Ishizaki, T., Miura, D., Kuno, A., Nagao, R., Aoki, S., Ohshima, Y., Kino, T., Usui, M., and Yamada, Y.
Published: 2016
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3. Novel heatsink for power semiconductor module using high thermal conductivity graphite

Author: Yamada, Y., Yanase, M., Miura, D., and Chikuba, K.
Published: 2016
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