8 results on '"Miao Meng"'
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2. Compact failure modeling for devices subject to electrostatic discharge stresses – A review pertinent to CMOS reliability simulation
3. Investigation of ESD protection strategy in high voltage Bipolar–CMOS–DMOS process
4. A novel power-clamp assisted complementary MOSFET for robust ESD protection
5. A novel gate-suppression technique for ESD protection
6. Substrate-engineered GGNMOS for low trigger voltage ESD in 65 nm CMOS process
7. Study of current saturation behaviors in dual direction SCR for ESD applications
8. Compact MOS-triggered SCR with faster turn-on speed for ESD protection
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