Author: "Mauran N" / Journal: microelectronics reliability - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Mauran N"' showing total 5 results

Start Over Author "Mauran N" Journal microelectronics reliability

5 results on '"Mauran N"'

1. Preconditioning of p-GaN power HEMT for reproducible Vth measurements

Author: Ghizzo, L., Trémouilles, D., Richardeau, F., Vinnac, S., Moreau, L., and Mauran, N.
Published: 2023
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2. 20 GHz on-chip measurement of ESD waveform for system level analysis

Author: Caignet, F., Nolhier, N., Bafleur, M., Wang, A., and Mauran, N.
Published: 2015
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3. On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress

Author: Caigneť, F., Nolhier, N., Bafleur, M., Wang, A., and Mauran, N.
Published: 2013
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4. ESD failure signature in capacitive RF MEMS switches

Author: Ruan, J., Papaioannou, G.J., Nolhier, N., Mauran, N., Bafleur, M., Coccetti, F., and Plana, R.
Published: 2008
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5. 20GHz on-chip measurement of ESD waveform for system level analysis

Author: Caignet, F., primary, Nolhier, N., additional, Bafleur, M., additional, Wang, A., additional, and Mauran, N., additional
Published: 2015
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