Author: "Jones, K.S." / Journal: microelectronics reliability - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Jones, K.S."' showing total 4 results

Start Over Author "Jones, K.S." Journal microelectronics reliability

4 results on '"Jones, K.S."'

1. Nanocrack formation in AlGaN/GaN high electron mobility transistors utilizing Ti/Al/Ni/Au ohmic contacts

Author: Whiting, P.G., Rudawski, N.G., Holzworth, M.R., Pearton, S.J., Jones, K.S., Liu, L., Kang, T.S., and Ren, F.
Published: 2017
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2. Erosion defect formation in Ni-gate AlGaN/GaN high electron mobility transistors

Author: Whiting, P.G., Holzworth, M.R., Lind, A.G., Pearton, S.J., Jones, K.S., Liu, L., Kang, T.S., Ren, F., and Xin, Y.
Published: 2017
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3. Under-gate defect formation in Ni-gate AlGaN/GaN high electron mobility transistors

Author: Whiting, P.G., primary, Rudawski, N.G., additional, Holzworth, M.R., additional, Pearton, S.J., additional, Jones, K.S., additional, Liu, L., additional, Kang, T.S., additional, and Ren, F., additional
Published: 2012
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4. Investigation of the effect of temperature during off-state degradation of AlGaN/GaN High Electron Mobility Transistors

Author: Douglas, E.A., primary, Chang, C.Y., additional, Gila, B.P., additional, Holzworth, M.R., additional, Jones, K.S., additional, Liu, L., additional, Kim, Jinhyung, additional, Jang, Soohwan, additional, Via, G.D., additional, Ren, F., additional, and Pearton, S.J., additional
Published: 2012
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