Author: "Huang, P.S." / Journal: microelectronics reliability - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Huang, P.S."' showing total 3 results

Start Over Author "Huang, P.S." Journal microelectronics reliability

3 results on '"Huang, P.S."'

1. Correction factors to strength of thin silicon die in three- and four-point bending tests due to nonlinear effects

Author: Tsai, M.Y. and Huang, P.S.
Published: 2022
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2. Mechanical design and analysis of direct-plated-copper aluminum nitride substrates for enhancing thermal reliability

Author: Tsai, M.Y., Huang, P.S., Lin, C.H., Wu, C.T., and Hu, S.C.
Published: 2015
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3. An investigation into warpages, stresses and keep-out zone in 3D through-silicon-via DRAM packages

Author: Tsai, M.Y., primary, Huang, P.S., additional, Huang, C.Y., additional, Lin, P.C., additional, Huang, Lawrence, additional, Chang, Michael, additional, Shih, Steven, additional, and Lin, J.P., additional
Published: 2014
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