6 results on '"Rooyackers, R."'
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2. Nanoprober-based EBIC measurements for nanowire transistor structures
3. Spacer defined FinFET: Active area patterning of sub-20 nm fins with high density
4. Spacer defined FinFET: Active area patterning of sub-20nm fins with high density
5. Stress variation across arrays of lines and its influence on LOCOS oxidation
6. Stress variation across arrays of lines and its influence on LOCOS oxidation
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