13 results on '"Adelmann"'
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2. Strain coupling optimization in magnetoelectric transducers
3. Demonstration of 2e12 cm− 2 eV− 1 2D-oxide interface trap density on back-gated MoS2 flake devices with 2.5 nm EOT
4. Understanding the EOT–Jg degradation in Ru/SrTiOx/Ru metal–insulator–metal capacitors formed with Ru atomic layer deposition
5. Low temperature chemical vapour synthesis of Cu3Ge thin films for interconnect applications
6. Scaled X-bar TiN/HfO2/TiN RRAM cells processed with optimized plasma enhanced atomic layer deposition (PEALD) for TiN electrode
7. The unexpected effects of crystallization on Ta2O5 as studied by HRTEM and C-AFM
8. An X-ray photoelectron spectroscopy study of strontium-titanate-based high-k film stacks
9. Atomic-layer-deposited tantalum silicate as a gate dielectric for III–V MOS devices
10. Towards barrier height modulation in HfO 2/TiN by oxygen scavenging – Dielectric defects or metal induced gap states?
11. High- k dielectrics for future generation memory devices (Invited Paper)
12. Demonstration of 2e12 cm−2eV−1 2D-oxide interface trap density on back-gated MoS2 flake devices with 2.5 nm EOT
13. Towards barrier height modulation in HfO2/TiN by oxygen scavenging – Dielectric defects or metal induced gap states?
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