8 results on '"MENG Miao"'
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2. Compact failure modeling for devices subject to electrostatic discharge stresses - A review pertinent to CMOS reliability simulation.
3. A novel gate-suppression technique for ESD protection.
4. Investigation of ESD protection strategy in high voltage Bipolar-CMOS-DMOS process.
5. A novel power-clamp assisted complementary MOSFET for robust ESD protection.
6. Study of current saturation behaviors in dual direction SCR for ESD applications.
7. Substrate-engineered GGNMOS for low trigger voltage ESD in 65 nm CMOS process.
8. Compact MOS-triggered SCR with faster turn-on speed for ESD protection.
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