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A method for the measurement of the S-parameters of semiconductor devices by means of a vector network analyzer and probe station in the millimetric range of frequencies is considered. A high level of precision of measurements is achieved through successive elimination of all error sources. Relationships that relate the effective parameters of the measurement system and the maximal error are presented. An experiment is carried out and results compared to analogous studies.

Methods of calculating the error of indirect measurements of the impedance of electronic components from the results of measurements of the S-parameters, carried out using a vector circuit analyzer are considered. Expressions are obtained relating the error in determining the impedance and the effective parameters of the measuring instrument. A typical calculation of the error using the example of the S5048 precision vector circuit analyzer is presented.

We consider the problem of determining the reliability of control when measurement error depends on component parameters. The error model we use is a polynomial.

The reliability of predictive control of product parameters in the presence of additive and multiplicative measurement errors is evaluated.

Component parameter monitoring reliability is estimated when the errors of measurement are dependent on the parameters. The solution amounts to a standard classical evaluation of monitoring reliability with statistical independence between the errors of measurement and the parameters.

It is shown that construction of the calibration characteristics of measuring devices may be reduced to expansion of these characteristics into Chebyshev polynomials. The coefficients of these polynomials (i.e., the parameters of the calibration characteristics) are determined by means of spectrum analyzers as the coefficients of the expansion into a Fourier series of the output signal of the device that arise when cosine signals arrive at the device 's input.

A description is given of a method of improving the accuracy of measurement of the frequency of electrical signals on the basis of their transformation. The method makes it possible to eliminate the additive component of the measurement error and reduce the multiplicative component.

A method is considered for making high-precision frequency measurements with simple, inexpensive, and inexact frequency meters.

The authors describe a mathematical model for fast calculation and analysis of the frequency characteristics of special axisymmetric (SAS) hydrogen quantum discriminator (HQD) resonators. Because of their improved axisymmetric construction and discriminator fabrication technology, compact high-Q cylindrical resonators operating in the H/sub 011/ wave mode are preferable for HQDs. The resonance frequencies of SAS resonators with dimensions closely resembling those used by HQDs are listed. The dependence of resonance frequency on the principal geometric dimensions of the resonator is shown.

Circuits with a 90° phase difference between currents can be used for a rapid and sufficiently accurate measurement of inductances and capacitances both with sinusoidal and nonsinusoidal supply voltages.

The reliability in operational checks can be improved by proper organization of twostage monitoring, in which operational monitoring is performed in the first stage, with more accurate but less rapid and more laborious checking in the second one [i]. Also, in the second stage one can check not only those parameters that are monitored in the first stage but also the intermediate ones governing them.