1. Microwave dielectric properties of Mg1.8Ti1.1O4 ceramics
- Author
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Huang, Cheng-Liang and Tseng, Yu-Wei
- Subjects
- *
CERAMIC materials , *ELECTRIC properties , *MICROWAVES , *SOLID state chemistry , *MOLECULAR structure , *SINTERING , *X-ray diffraction - Abstract
Abstract: Low-loss Mg1.8Ti1.1O4 ceramics were prepared by the conventional solid-state route and their microwave dielectric properties were investigated for the first time. The forming of tetragonal-structured Mg1.8Ti1.1O4 main phase associated with a second phase MgTiO3 were confirmed by the X-ray diffraction patterns. However, the presence of the second phase would cause no significant variance in the dielectric properties of the specimen because the second phase properties are very similar to that of the main phase. A fine combination of microwave dielectric properties (ɛ r ∼15.74, Q × f ∼141,000GHz at 10.57GHz, τ f ∼−52.4ppm/°C) was achieved for Mg1.8Ti1.1O4 ceramics sintered at 1450°C for 4h. [Copyright &y& Elsevier]
- Published
- 2010
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