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Your search keyword '"SCANNING electron microscopes"' showing total 1 results

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Start Over You searched for: Descriptor "SCANNING electron microscopes" Remove constraint Descriptor: "SCANNING electron microscopes" Search Limiters Academic (Peer-Reviewed) Journals Remove constraint Search Limiters: Academic (Peer-Reviewed) Journals Journal materials characterization Remove constraint Journal: materials characterization Region turkey Remove constraint Region: turkey Publisher elsevier b.v. Remove constraint Publisher: elsevier b.v.
1 results on '"SCANNING electron microscopes"'

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1. Characterization of materials used in the execution of historic oil paintings by XRD, SEM-EDS, TGA and LIBS analysis

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