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A new robust structured light technique based on multi-valued pseudo-random color encoded pattern is discussed in this paper. After analyzing the advantages and disadvantages of the existing pseudo-random coding patterns in computer vision, a new multi-valued pseudo-random color encoded pattern is designed on the basis of the combination of the feature points and the feature lines. Using this pattern, the feature points are easy to extract, and the problems of leaking points and pseudo-feature points are greatly reduced. Furthermore, it also reduced the difficulty and the complexity of the feature matching because of the feature lines.

A measuring method of large sized workpiece based on SIFT algorithm is proposed in this paper. After the different image matching algorithms are compared, SIFT algorithm, which has much more robust, is introduced in detail. Then measuring platform is built, and large sized workpiece is measured by SIFT image stitching and image processing. The experiment proves that SIFT algorithm is viable and advantageous in the measurement of large sized workpiece. At last, the precision and affecting factors are analyzed.