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Your search keyword '"Schropp, Andreas"' showing total 11 results
Start Over Author "Schropp, Andreas" Journal journal of synchrotron radiation
11 results on '"Schropp, Andreas"'

1. Single-exposure X-ray phase imaging microscopy with a grating interferometer

Author

Wolf, Andreas, primary, Akstaller, Bernhard, additional, Cipiccia, Silvia, additional, Flenner, Silja, additional, Hagemann, Johannes, additional, Ludwig, Veronika, additional, Meyer, Pascal, additional, Schropp, Andreas, additional, Schuster, Max, additional, Seifert, Maria, additional, Weule, Mareike, additional, Michel, Thilo, additional, Anton, Gisela, additional, and Funk, Stefan, additional

Published
2022
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2. The High Energy Density Scientific Instrument at the European XFEL

Author

Zastrau, Ulf, primary, Appel, Karen, additional, Baehtz, Carsten, additional, Baehr, Oliver, additional, Batchelor, Lewis, additional, Berghäuser, Andreas, additional, Banjafar, Mohammadreza, additional, Brambrink, Erik, additional, Cerantola, Valerio, additional, Cowan, Thomas E., additional, Damker, Horst, additional, Dietrich, Steffen, additional, Di Dio Cafiso, Samuele, additional, Dreyer, Jörn, additional, Engel, Hans-Olaf, additional, Feldmann, Thomas, additional, Findeisen, Stefan, additional, Foese, Manon, additional, Fulla-Marsa, Daniel, additional, Göde, Sebastian, additional, Hassan, Mohammed, additional, Hauser, Jens, additional, Herrmannsdörfer, Thomas, additional, Höppner, Hauke, additional, Kaa, Johannes, additional, Kaever, Peter, additional, Knöfel, Klaus, additional, Konôpková, Zuzana, additional, Laso García, Alejandro, additional, Liermann, Hanns-Peter, additional, Mainberger, Jona, additional, Makita, Mikako, additional, Martens, Eike-Christian, additional, McBride, Emma E., additional, Möller, Dominik, additional, Nakatsutsumi, Motoaki, additional, Pelka, Alexander, additional, Plueckthun, Christian, additional, Prescher, Clemens, additional, Preston, Thomas R., additional, Röper, Michael, additional, Schmidt, Andreas, additional, Seidel, Wolfgang, additional, Schwinkendorf, Jan-Patrick, additional, Schoelmerich, Markus O., additional, Schramm, Ulrich, additional, Schropp, Andreas, additional, Strohm, Cornelius, additional, Sukharnikov, Konstantin, additional, Talkovski, Peter, additional, Thorpe, Ian, additional, Toncian, Monika, additional, Toncian, Toma, additional, Wollenweber, Lennart, additional, Yamamoto, Shingo, additional, and Tschentscher, Thomas, additional

Published
2021
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5. Nanofocusing with aberration-corrected rotationally parabolic refractive X-ray lenses

Author

Seiboth, Frank, Wittwer, Felix, Scholz, Maria, Kahnt, Maik, Seyrich, Martin, Schropp, Andreas, Wagner, Ulrich, Rau, Christoph, Garrevoet, Jan, Falkenberg, Gerald, and Schroer, Christian G.

Subjects
refractive X-ray optics, genetic structures, phase plate, ddc:540, Astrophysics::Instrumentation and Methods for Astrophysics, ptychography, Physics::Optics, Photondiag2017 Workshop, sense organs, aberration correction, eye diseases
Abstract

Journal of synchrotron radiation 25(1), 1 - 8 (2018). doi:10.1107/S1600577517015272, Wavefront errors of rotationally parabolic refractive X-ray lenses made of beryllium (Be CRLs) have been recovered for various lens sets and X-ray beam configurations. Due to manufacturing via an embossing process, aberrations of individual lenses within the investigated ensemble are very similar. By deriving a mean single-lens deformation for the ensemble, aberrations of any arbitrary lens stack can be predicted from the ensemble with \bar{\sigma} = 0.034λ. Using these findings the expected focusing performance of current Be CRLs are modeled for relevant X-ray energies and bandwidths and it is shown that a correction of aberrations can be realised without prior lens characterization but simply based on the derived lens deformation. The performance of aberration-corrected Be CRLs is discussed and the applicability of aberration-correction demonstrated over wide X-ray energy ranges., Published by IUCr, Chester

Published
2018

6. Single-pulse phase-contrast imaging at free-electron lasers in the hard X-ray regime

Author

Hagemann, Johannes, primary, Vassholz, Malte, additional, Hoeppe, Hannes, additional, Osterhoff, Markus, additional, Rosselló, Juan M., additional, Mettin, Robert, additional, Seiboth, Frank, additional, Schropp, Andreas, additional, Möller, Johannes, additional, Hallmann, Jörg, additional, Kim, Chan, additional, Scholz, Markus, additional, Boesenberg, Ulrike, additional, Schaffer, Robert, additional, Zozulya, Alexey, additional, Lu, Wei, additional, Shayduk, Roman, additional, Madsen, Anders, additional, Schroer, Christian G., additional, and Salditt, Tim, additional

Published
2021
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8. A versatile nanoreactor for complementary in situ X-ray and electron microscopy studies in catalysis and materials science

Author

Fam, Yakub, primary, Sheppard, Thomas L., additional, Becher, Johannes, additional, Scherhaufer, Dennis, additional, Lambach, Heinz, additional, Kulkarni, Satishkumar, additional, Keller, Thomas F., additional, Wittstock, Arne, additional, Wittwer, Felix, additional, Seyrich, Martin, additional, Brueckner, Dennis, additional, Kahnt, Maik, additional, Yang, Xiaogang, additional, Schropp, Andreas, additional, Stierle, Andreas, additional, Schroer, Christian G., additional, and Grunwaldt, Jan-Dierk, additional

Published
2019
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10. The Matter in Extreme Conditions instrument at the Linac Coherent Light Source

Author

Nagler, Bob, primary, Arnold, Brice, additional, Bouchard, Gary, additional, Boyce, Richard F., additional, Boyce, Richard M., additional, Callen, Alice, additional, Campell, Marc, additional, Curiel, Ruben, additional, Galtier, Eric, additional, Garofoli, Justin, additional, Granados, Eduardo, additional, Hastings, Jerry, additional, Hays, Greg, additional, Heimann, Philip, additional, Lee, Richard W., additional, Milathianaki, Despina, additional, Plummer, Lori, additional, Schropp, Andreas, additional, Wallace, Alex, additional, Welch, Marc, additional, White, William, additional, Xing, Zhou, additional, Yin, Jing, additional, Young, James, additional, Zastrau, Ulf, additional, and Lee, Hae Ja, additional

Published
2015
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11. Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis

Author

Sikorski, Marcin, primary, Song, Sanghoon, additional, Schropp, Andreas, additional, Seiboth, Frank, additional, Feng, Yiping, additional, Alonso-Mori, Roberto, additional, Chollet, Matthieu, additional, Lemke, Henrik T., additional, Sokaras, Dimosthenis, additional, Weng, Tsu-Chien, additional, Zhang, Wenkai, additional, Robert, Aymeric, additional, and Zhu, Diling, additional

Published
2015
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