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A new facility for high-pressure diffraction and spectroscopy using diamond anvil high-pressure cells has been built at the Advanced Light Source on beamline 12.2.2. This beamline benefits from the hard X-radiation generated by a 6 T superconducting bending magnet (superbend). Useful X-ray flux is available between 5 keV and 35 keV. The radiation is transferred from the superbend to the experimental enclosure by the brightness-preserving optics of the beamline. These optics are comprised of a plane parabola collimating mirror, followed by a Kohzu monochromator vessel with Si(111) crystals (E/DeltaE approximately equal 7000) and W/B4C multilayers (E/DeltaE approximately equal 100), and then a toroidal focusing mirror with variable focusing distance. The experimental enclosure contains an automated beam-positioning system, a set of slits, ion chambers, the sample positioning goniometry and area detector (CCD or image-plate detector). Future developments aim at the installation of a second endstation dedicated to in situ laser heating and a dedicated high-pressure single-crystal station, applying both monochromatic and polychromatic techniques.

The possibility of using X-ray diffraction to precisely monitor crystal structure at the extremes of pressure and temperature produced by shock-wave loading is explored. A summary of the advantages of using various X-ray sources for this work and an outline of the necessary experimental layout is given.

A new facility for simultaneous extended X-ray absorption of fine structure (EXAFS), X-ray diffraction and photoluminescence measurements under high pressures has been developed for use on station 9.3 at the Daresbury Laboratory Synchrotron Radiation Source. This high-pressure facility can be used at any suitable beamline at a synchrotron source. Full remote operation of the rig allows simultaneous collection of optical and structural data while varying the pressure. The set-up is very flexible and can be tailored for a particular experiment, such as time- or temperature-dependent measurements. A new approach to the collection of high-pressure EXAFS data is also presented. The approach significantly shortens the experimental times and allows a dramatic increase in the quality of EXAFS data collected. It also opens up the possibility for EXAFS data collection at any pressure which can be generated using a diamond cell. The high quality of data collected is demonstrated with a GaN case study. Particular attention will be paid to the use of energy-dispersive EXAFS and quick-scanning EXAFS techniques under pressure.

A complementary pair of rapid methods for the energy calibration of solid-state detectors have been developed. Each method requires only a single measurement from either (i) a glass sample containing elements chosen to produce fluorescence lines over a suitable energy range when exposed to a polychromatic beam of X-rays, or (ii) a powder diffraction standard in the presence of diffraction slits. The fluorescent glass method has the advantage of allowing simultaneous energy calibration of a number of detectors without requiring diffraction slits. There is the potential for the glass material to be incorporated into virtually any sample holder to allow a continuous in situ calibration. Complementary observations of a powder diffraction standard allow simultaneous calibration of diffraction 2theta and monitoring of the detector for drift.

An X-ray energy-dispersive diffraction technique to study the texture of materials using synchrotron radiation has been developed. The design and commissioning of the diffraction instrument are described. The technique was first applied to study a drawn-wire aluminum sample which has a well known deformation texture. To demonstrate its capability further, results obtained from an erbium evaporated thin film are also presented.