1. Application of GRID to foreign atom localization in single crystals
- Author
-
Jentschel M, H.G. Börner, Karmann A, Weber B, and Werner Wesch
- Subjects
lifetime ,Materials science ,Astrophysics::High Energy Astrophysical Phenomena ,General Engineering ,Gamma ray ,chemistry.chemical_element ,gamma-spectroscopy ,Crystal structure ,YAlO3 ,Article ,erbium ,Erbium ,symbols.namesake ,chemistry ,Atom ,symbols ,Gamma spectroscopy ,impurity location ,Physics::Atomic Physics ,Atomic physics ,Spectroscopy ,Doppler effect ,Doppler broadening - Abstract
The application of GRID (Gamma Ray Induced Doppler broadening) spectroscopy to the localization of foreign atoms in single crystals is demonstrated on erbium in YAP. By the investigation of the Doppler broadened secondary {gamma} line for two crystalline directions, the Er was determined to be localized on the Y site. Conditions for the nuclear parameters of the impurity atoms used for the application of GRID spectroscopy are discussed.
- Published
- 2000
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