1. Quantification of non-bridging oxygens in silicates using X-ray Raman scattering.
- Author
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de Clermont Gallerande, E., Cabaret, D., Radtke, G., Sahle, Ch. J., Ablett, J.M., Rueff, J.-P., and Lelong, G.
- Subjects
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X-ray scattering , *RAMAN scattering , *SILICATES , *X-ray spectroscopy , *LITHIUM silicates , *SOFT X rays , *INELASTIC scattering - Abstract
Detecting and quantifying non-bridging oxygen (NBO) atoms is of particular interest for understanding the physical properties of melts or compressed materials, and requires an unequivocal spectral signature usable during in situ measurements. In this paper, we evidence a low-energy feature of NBO in lithium silicate crystals using X-ray Raman scattering (XRS) spectroscopy around the energy losses of the oxygen K -edge. A specific peak at 534–535 eV in the edge onset is unequivocally attributed to the presence of NBO. Its intensity is used to quantify NBO in lithium silicate glasses. A similar feature at low energy has also been evidenced in Na 2 SiO 3 and MgSiO 3 , generalizing the method to other alkali and alkali-earth silicates. This non-destructive method of NBO quantification, which is based on an X-ray inelastic scattering technique, can be extended to other spectroscopies such as electron-energy loss spectroscopy, and soft X-ray absorption spectroscopy at the oxygen K edge. [ABSTRACT FROM AUTHOR]
- Published
- 2020
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