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In this study, AZO thin films were deposited on glass by using a 98 mol% ZnO + 1 mol% Al2O3 (AZO, Zn : Al = 98 : 2) ceramic target and a r.f. magnetron sputtering system. At first, the effects of different H2 flow rates (H2/(H2 +Ar) = 0%~9.09%, abbreviated as H2-deposited AZO thin films, deposition temperature was 200°C) added during the deposition process on the physical and electrical properties of AZO thin films were investigated. The optical transmittance at 400 nm~700 nm is more than 80% for all AZO thin films regardless of H2 flow rate and the transparency ratio decreased as the H2 flow rate increased. The Burstein-Moss shift effect was used to prove that the defects of AZO thin films decreased with increasing H2 flow rate. Also, the 2% H2-deposited AZO thin films were also treated by the H2 plasma at room temperature for 60 min (plasma-treated AZO thin films). The value variations in the optical band gap (Eg) values of the H2-deposited and plasma-treated AZO thin films were evaluated from the plots of (αhv)² = c(hv - Eg), and the Eg values increased with increasing H2 flow rate. The Eg values also increased as the H2-plasma process was used to treat on the H2-deposited Al2O3-doped ZnO (AZO) thin films. [ABSTRACT FROM AUTHOR]

We investigated a two-stepmethod to deposit the ZnO-based nanostructure films, including nanorods and nanoflowers. In the first step, sputtering method was used to deposit the ZnO films on SiO2/Si substrates as the seed layer. In the second step, Zn(NO3)2- 6H2O and C6H12N4 were used as precursors and hydrothermal process was used as the method to synthesize the ZnO films. After that, the ZnO films were measured by an X-ray diffraction pattern and a FESEM to analyze their crystallization and morphology. We had found that the ZnO films had three different morphologies synthesized on ZnO/SiO2/Si substrates, including irregularplate structure films, nanorod films, and beautiful chrysanthemum-like clusters (nanoflower films). We would prove that the face direction of ZnO/SiO2/Si substrates in the hydrothermal bottle and deposition time were two important factors to influence the synthesized results of the ZnO films. [ABSTRACT FROM AUTHOR]

Gallium-doped zinc oxide (GZO) thin films were deposited on glass, and the process parameters are RF power of 50W and working pressure of 5 m Torr, and the substrate temperature was changed from room temperature to 300°C. At first, the thickness was around 300 nm by controlling the deposition time. The effects of substrate temperature on the crystallinity, lattice constant (c), carrier mobility, carrier concentration, resistivity, and optical transmission rate of the GZO thin films were studied. The 200°C-deposited GZO thin films had the best crystallinity, the larger carrier concentration and carrier mobility, and the lowest resistivity. For that, the thickness of the GZO thin films was extended to around 1000 nm. Hydrochloric (HCl) acid solutions with different concentrations (0.1%, 0.2%, and 0.5%) were used to etch the surfaces of the GZO thin films, which were then used as the substrate electrodes to fabricate the p-i-n α-Si:H thin-film solar cells. The haze ratio of the GZO thin films increased with increasing HCl concentration, and that would effectively enhance light trapping inside the absorber material of solar cells and then improve the efficiency of the fabricated thin-film solar cells. [ABSTRACT FROM AUTHOR]