1. Differential Resistance Testing for InP-Based Semiconductor Optical Amplifiers
- Author
-
Martin H. Hu, Hong Ky Nguyen, M. Wieckowski, and M. Margala
- Subjects
Optical amplifier ,Engineering ,Subthreshold conduction ,business.industry ,Atomic and Molecular Physics, and Optics ,Signature (logic) ,law.invention ,Semiconductor ,law ,Electronic engineering ,Optical circulator ,Stimulated emission ,Resistor ,business ,Testability - Abstract
A new method for electrically measuring optical performance degradation in InP-based semiconductor optical amplifiers (SOAs) is presented. It is shown that this degradation can be directly qualified through measurements of electrical subthreshold differential resistance. Experimental measurements are presented along with a theoretical analysis to demonstrate a proposed aging signature. Furthermore, two system designs are presented based on using this signature for enhancing device testability.
- Published
- 2009