1. X-ray photoelectron diffraction (XPED) and X-ray spectro-holography from the contributions of our instruments.
- Author
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Nojima, Masashi and Nihei, Yoshimasa
- Subjects
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X-ray diffraction , *SCIENTIFIC apparatus & instruments , *X-rays , *HARD X-rays , *HOLOGRAPHY , *SOFT X rays - Abstract
This paper reviews our contributions and the development of an instrument for X-ray photoelectron diffraction (XPED) and X-ray holography. XPED and X-ray holography have been extensively applied in materials analysis over the past decades. We made pioneering contributions in this area that fueled the development of the corresponding instrumentation and technology. In this review, we briefly discuss the theory of XPED and X-ray holography instrument, the genesis, and applications. The instruments comprise a high-power soft and hard X-ray source as well as a diffraction aperture; further, they are capable of high-angular-resolution detection and patterning. The applications of these instruments for practical surface analysis are also reviewed for ultrathin insulators, catalysts, and magnetic materials. Finally, possibilities for the differential photoelectron holography (DPH) approach are premiered based on a novel approach. • This paper reviews our contributions and the development of instruments for XPED and X-ray holography over the last decades. • We demonstrated our original laboratory-level XPED instruments from the perspectives of a high-power soft and hard X-ray source, diffraction aperture, and high-angular-resolution detection. • We also demonstrated applications of practical surface analysis for ultrathin insulators, catalysts, and magnetic materials. • We premiered possibilities for differential photoelectron holography (DPH) based on the atomic reconstruction method using typical four-wave numbers. [ABSTRACT FROM AUTHOR]
- Published
- 2022
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