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Scandium is introduced into bulk SiC during the physical vapor transport (PVT) growth. SiC crystals grown with different Sc contents (from 0.5 wt% up to 2.5 wt%, added to the SiC source material) are studied. Magnetic properties of SiC doped with scandium during the PVT growth are reported for the first time. The presence of antiferromagnetic interactions between magnetic moments of Sc ions is concluded from the temperature dependence of magnetic susceptibility. Detailed PL spectra of 4H-/6H-SiC:B and 4H-/6H-SiC:Sc crystals are presented. A new energy level of 35–37 meV is found on SiC:Sc samples and its possible assignment to a complex defect, consisting of nitrogen donor and scandium acceptor, is proposed.

SiC crystals grown by a Physical Vapor Transport (PVT) method in the presence of varying Ce impurity contents (from 0.1 wt% up to 2.5 wt%) added to SiC source material are investigated. The presence of the cerium vapor in the growth atmosphere is confirmed by X-ray photoelectron spectroscopy measurements. Different electrical properties of SiC crystals are obtained while use was made of non-oxide (CeSi 2 ) or oxide (CeO 2 ) sources of Ce impurity. The impact of cerium on low concentrations of boron atoms in bulk SiC is reported. Presence of Ce in the vapor stabilizes the growth of the 4H-SiC polytype.

The effect of the presence of CeO2 in the source material on the properties of SiC crystals grown by Physical Vapor Transport (PVT) method is investigated. The doping efficiency and, indirectly, the presence of the cerium vapour in the growth atmosphere were examined by study of structural, electrical and optical properties of the crystals. X-ray photoelectron spectroscopy shows that Ce2O3 and CeO2 coexist on the SiC post-growth surfaces. A detectable Ce incorporation is observed only in the last grown part of the crystal.