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The poly[2-methoxy-5-(2'-ethylhexyloxy)-p-phenylene vinylene] (MEH-PPV)/poly(3-hexylthiophene) (P3HT) heterojunction was investigated by photoemission spectroscopy. The orbital line-up at the MEH-PPV/P3HT heterojunction was determined based on the data of X-ray and ultra-violet photoemission measurements. The results were discussed with reference to the Induced Density of Interface States (IDIS) and integer charge transfer models. The predicted interface orbital line-up by IDIS is in agreement with measured energy alignment of the investigated interface. This suggests the IDIS model is also valid for polymer/polymer heterojunctions. [ABSTRACT FROM AUTHOR]

The Al/poly(3-hexylthiophene) (P3HT) and Ag/P3HT interfaces were investigated using photoemission spectroscopy in combination with in situ thin-film deposition. The P3HT thin films were deposited directly into high vacuum from solution on the two metal substrates using an electrospray system and characterized via photoemission spectroscopy. The electronic structure and charge injection barriers at these interfaces were determined from the evaluation of the resulting spectra sequences. A linear correlation between barrier heights and substrate work functions was observed from the collected data in combination with previously published results, suggesting that the 'Induced Density of Interfaces States' model for small molecular materials is also valid for conjugated polymer interfaces. The corresponding P3HT 'screening factor' as well as its charge neutrality level was determined to be 0.48 and 3.44 eV, respectively. [ABSTRACT FROM AUTHOR]